Measuring The Permittivity Of Fused Silica With Planar On-wafer Structures Up To 325 GHz

Name: Measuring The Permittivity Of Fused Silica With Planar On-wafer Structures Up To 325 GHz
Creator: US Government
License: https://www.nist.gov/open/license

National Institute of Standards and Technology

@usgov.national_institute_of_standard_measuring_the_permittiv_9214ee57

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