Measuring The Permittivity Of Fused Silica With Planar On-wafer Structures Up To 325 GHz

Name: Measuring The Permittivity Of Fused Silica With Planar On-wafer Structures Up To 325 GHz
Creator: US Government
Published: 2025-06-18T02:47:57.734Z
License: https://www.nist.gov/open/license

US Government